X-ray nondestructive testing technology - 5

For each frame of the flaw detection image containing the defect, the system needs to know the number of defects, the size of the defect, and the position information of the defect, so that the defect can be judged according to a certain standard. In this paper, the method of gray accumulation is used to calculate the number, size and position information of defects. The method is simple and effective, and it is only necessary to accumulate the number of defective pixels on the horizontal axis. The specific step of the gradation accumulation method is to accumulate the number of black dot pixels in each column in the horizontal direction (ie, on the horizontal axis) of the detection area (the black dot pixels are defective pixels detected by the aforementioned blur defect detection algorithm). As shown in Fig. 5, the horizontal axis represents the position of the black dot pixel, and the vertical axis represents the number of black dot pixels accumulated in the horizontal direction. After accumulating the number of black dot pixels per column to the horizontal axis, the defect can be determined by determining the starting coordinates of the number of black dot pixels and the ending coordinates X1, Xr and the highest value y of the number of black dot pixels. Width, height, and displacement of the defect on the screen. They are:

Defect width: Xr-X1
The height of the defect: Y;
Defect of the defect on the screen: (Xr+X1)/2

In order to ensure the accuracy of the defect size calculation, the width and height of the defect are averaged, and the size of the defect can be obtained as [(Xr+X1)+y]/2

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